HUATEC GROUP CORPORATION

HUATEC GROUP CORPORATION Professional Non Destructive Testing Equipment

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Lightweight Wireless Flat Panel DR Detector Based On Amorphous Silicon A-Si For Various Fields DR And Non-Destructive Testing

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HUATEC GROUP CORPORATION
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City:beijing
Province/State:beijing
Country/Region:china
Contact Person:MsShifen Yuan
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Lightweight Wireless Flat Panel DR Detector Based On Amorphous Silicon A-Si For Various Fields DR And Non-Destructive Testing

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Brand Name :Huatec
Model Number :H3543HWC-EG
Certification :ISO,CE
Place of Origin :China
MOQ :1 set
Payment Terms :L/C, T/T, Western Union
Supply Ability :50 sets per month
Delivery Time :7-10 working days after payment
Packaging Details :in carton box
Product name :DR and Non-destructive testing detector
Model :H3543HWC-EG
Receptor Type :a-Si
Scintillator :Gos / CsI:TI
Active Area :350 x 430 mm
Pixel Pitch :139 μm
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Lightweight Wireless Flat Panel DR Detector Based on Amorphous Silicon(a-Si) For Various Fields DR and Non-Destructive Testing

Electricals and interface
A/D Conversion 16 bits

Data Interface Gigabit Ethernet/802.11ac (only 5G)

Acquire Time wired: 1s; wireless: 3s

Exposure Control Software/AED
Memory 4 GB DDR4, 8 GB SD card

Mechanical
Dimension 388.8×459×15 mm
Weight 3.4kg (without battery)

Material Aluminum andmagnesium alloys

Front Panel Carbon fiber

Narrowest edgedistance≤5mm

Enviromental

Temperature 10-35°C (operating);-10~50°C (storage)

Humidity 30-70% RH (non-condensing)

Ingress Protection IP51 (Customized to IP67)

Sensor
Receptor Type a-Si

Scintillator Gos / CsI:TI

Active Area 350 x 430 mm

Resolution 2560 x 3072

Pixel Pitch 139 μm

Power Supply & Battery

Adapter In AC 100-240V,50-60Hz

Adapter Out DC 24V,2.7A

Power Dissipation <20 W

Standby Time 6.5h

Recharge Time 4.5 h

Image Quality
Limiting Resolution 5 LP/mm

Energy Range 40-160 KV

Dynamic Range ≥76 dB

Sensitivity ≥0.36LSB/nGy

Ghos <1% 1st frame

DQE 38% @(1 LP/mm)

21% @(2 LP/mm)

MTF 75% @(1 LP/mm)

48% @(2 LP/mm)

28% @(3 LP/mm)

Lightweight Wireless Flat Panel DR Detector Based On Amorphous Silicon A-Si For Various Fields DR And Non-Destructive Testing

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